Xiong Du,
Jun Zhang,
Gaoxian Li,
Yaoyi Yu,
Cheng Qian,
Rui Du
e.a.
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Gebonden Engels 2022 9789811931314
Verwachte levertijd ongeveer 9 werkdagen
Samenvatting
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
Specificaties
ISBN13:9789811931314
Taal:Engels
Bindwijze:gebonden
Uitgever:Springer Nature Singapore
Lezersrecensies
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Inhoudsopgave
<div>Introduction.- Thermal fatigue failure mechanism of power devices in renewable energy system.- Thermal model and thermal parameters monitoring.- Thermal analysis of power semiconductor device in renewable energy system.- Multi-time scale lifetime evaluation for the device in the renewable application.- Thermal management design and optimization.- Prospect.</div>
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